![]() ![]() This paper comparatively examined the commonly used methods such as empirically based failure rate modeling methodologies used in reliability prediction handbooks, and physics of failure (PoF) based models. Different reliability prediction methods or models are available for electronic devices. It is needed at various system levels and degrees of detail, in order to evaluate, determine and improve the dependability measures of an item when designing electronic devices in view of the high level competition among device manufacturers. Reliability prediction is vital in the conception, definition, design, development, operation and maintenance phase of electronic devices.
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